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"Effect of interface charge on the dc bias stress-induced deformation and ..."

Magali Estrada, Antonio Cerdeira, Benjamín Iñíguez (2012)

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DOI: 10.1016/J.MICROREL.2012.02.026

access: closed

type: Journal Article

metadata version: 2020-02-22

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Magali Estrada, Antonio Cerdeira, Benjamín Iñíguez:
Effect of interface charge on the dc bias stress-induced deformation and shift of the transfer characteristic of amorphous oxide thin-film transistors. Microelectron. Reliab. 52(7): 1342-1345 (2012)

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