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"Modeling bimodal electromigration failure distributions."

A. H. Fischer et al. (2001)

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DOI: 10.1016/S0026-2714(00)00246-8

access: closed

type: Journal Article

metadata version: 2020-02-22

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A. H. Fischer, A. Abel, M. Lepper, A. E. Zitzelsberger, A. von Glasow:
Modeling bimodal electromigration failure distributions. Microelectron. Reliab. 41(3): 445-453 (2001)

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