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"Reliability and performance scaling of very high speed SiGe HBTs."

Greg G. Freeman et al. (2004)

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DOI: 10.1016/J.MICROREL.2003.11.003

access: closed

type: Journal Article

metadata version: 2022-03-02

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Greg G. Freeman, Jae-Sung Rieh, Zhijian Yang, Fernando J. Guarín:
Reliability and performance scaling of very high speed SiGe HBTs. Microelectron. Reliab. 44(3): 397-410 (2004)

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