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"How to study delamination in plastic encapsulated devices."

Hélène Frémont et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.07.015

access: closed

type: Journal Article

metadata version: 2020-02-22

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Hélène Frémont, Jean-Yves Delétage, Kirsten Weide-Zaage, Yves Danto:
How to study delamination in plastic encapsulated devices. Microelectron. Reliab. 44(9-11): 1311-1316 (2004)

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