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"Exploring the use of approximate TMR to mask transient faults in logic ..."

Iuri A. C. Gomes et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.06.125

access: closed

type: Journal Article

metadata version: 2020-02-22

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Iuri A. C. Gomes, Mayler G. A. Martins, André Inácio Reis, Fernanda Lima Kastensmidt:
Exploring the use of approximate TMR to mask transient faults in logic with low area overhead. Microelectron. Reliab. 55(9-10): 2072-2076 (2015)

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