"Characterisation method for chip card ESD events causing terminal failures."

Gerhard Groos (2012)

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DOI: 10.1016/J.MICROREL.2012.06.072

access: closed

type: Journal Article

metadata version: 2020-02-22

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Gerhard Groos:
Characterisation method for chip card ESD events causing terminal failures. Microelectron. Reliab. 52(9-10): 2005-2009 (2012)

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