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"Ultra-fast CAD scan chain highlighting for failure analysis assistance."

Markus Grützner, Christian Burmer, Christof Brillert (2010)

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DOI: 10.1016/J.MICROREL.2010.07.145

access: closed

type: Journal Article

metadata version: 2020-02-22

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Markus Grützner, Christian Burmer, Christof Brillert:
Ultra-fast CAD scan chain highlighting for failure analysis assistance. Microelectron. Reliab. 50(9-11): 1494-1498 (2010)

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