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"Issues concerning charged device model ESD verification modules - the need ..."

Leo G. Henry et al. (2001)

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DOI: 10.1016/S0026-2714(00)00237-7

access: closed

type: Journal Article

metadata version: 2020-10-01

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Leo G. Henry, Mark A. Kelly, Tom Diep, Jon Barth:
Issues concerning charged device model ESD verification modules - the need to move to alumina. Microelectron. Reliab. 41(3): 407-415 (2001)

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