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"A novel impact test system for more efficient reliability testing."

Jussi Hokka et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.04.015

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jussi Hokka, Toni T. Mattila, Jue Li, Jarmo Teeri, Jorma K. Kivilahti:
A novel impact test system for more efficient reliability testing. Microelectron. Reliab. 50(8): 1125-1133 (2010)

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