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"Realizing high breakdown voltage for a novel interface charges islands ..."

Shengdong Hu et al. (2012)

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DOI: 10.1016/J.MICROREL.2011.11.007

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/mr/HuLTZLZZGQZ12
Shengdong Hu, Jun Luo, Kaizhou Tan, Ling Zhang, Zhaoji Li, Bo Zhang, Jianlin Zhou, Ping Gan, Guolin Qin, Zhengyuan Zhang:
Realizing high breakdown voltage for a novel interface charges islands structure based on partial-SOI substrate. Microelectron. Reliab. 52(4): 692-697 (2012)

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