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"Reliability and routability consideration for MCM placement."

Yu-Jung Huang, Mei-hui Guo, Shen-Li Fu (2002)

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DOI: 10.1016/S0026-2714(01)00228-1

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/HuangGF02
Yu-Jung Huang, Mei-hui Guo, Shen-Li Fu:
Reliability and routability consideration for MCM placement. Microelectron. Reliab. 42(1): 83-91 (2002)

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