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"A thorough investigation of MOSFETs NBTI degradation."

Vincent Huard et al. (2005)

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DOI: 10.1016/J.MICROREL.2004.04.027

access: closed

type: Journal Article

metadata version: 2023-09-30

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Vincent Huard, M. Denais, F. Perrier, Nathalie Revil, C. R. Parthasarathy, Alain Bravaix, E. Vincent:
A thorough investigation of MOSFETs NBTI degradation. Microelectron. Reliab. 45(1): 83-98 (2005)

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