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"Electroluminescence spectroscopy for reliability investigations of 1.55 ..."

S. Huyghe et al. (2005)

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DOI: 10.1016/J.MICROREL.2005.07.067

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/HuygheBZDADLGD05
S. Huyghe, Laurent Béchou, Nicolas Zerounian, Yannick Deshayes, Frédéric Aniel, A. Denolle, Dominique Laffitte, Jean-Luc Goudard, Yves Danto:
Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier. Microelectron. Reliab. 45(9-11): 1593-1599 (2005)

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