"Observations on the recovery of hot carrier degradation of ..."

Maurits J. de Jong, Cora Salm, Jurriaan Schmitz (2017)

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DOI: 10.1016/J.MICROREL.2017.07.038

access: closed

type: Journal Article

metadata version: 2021-10-14

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Maurits J. de Jong, Cora Salm, Jurriaan Schmitz:
Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs. Microelectron. Reliab. 76-77: 136-140 (2017)

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