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"High speed test interface module using MEMS technology."

Nabeeh Kandalaft, Ali Attaran, Rashid Rashidzadeh (2015)

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DOI: 10.1016/J.MICROREL.2014.11.010

access: closed

type: Journal Article

metadata version: 2020-02-22

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Nabeeh Kandalaft, Ali Attaran, Rashid Rashidzadeh:
High speed test interface module using MEMS technology. Microelectron. Reliab. 55(2): 374-382 (2015)

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