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"Characterization and modelling of ageing failures on power MOSFET devices."
B. Khong et al. (2007)
- B. Khong, Marc Legros, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Colette Levade, G. Vanderschaeve, Emmanuel Scheid:
Characterization and modelling of ageing failures on power MOSFET devices. Microelectron. Reliab. 47(9-11): 1735-1740 (2007)
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