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"Innovative Methodology for Predictive Reliability of Intelligent Power ..."

B. Khong et al. (2005)

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DOI: 10.1016/J.MICROREL.2005.07.104

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/KhongTDCLDLVDF05
B. Khong, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Marc Legros, A. Deram, Colette Levade, G. Vanderschaeve, Jean-Marie Dorkel, Jean-Pierre Fradin:
Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue. Microelectron. Reliab. 45(9-11): 1717-1722 (2005)

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