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"Effect of DC/AC stress on the reliability of cell capacitor in DRAM."

Gang-Jun Kim et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.06.117

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/KimLKSL18
Gang-Jun Kim, Nam-Hyun Lee, Jongkyun Kim, Jung Eun Seok, Yunsung Lee:
Effect of DC/AC stress on the reliability of cell capacitor in DRAM. Microelectron. Reliab. 88-90: 179-182 (2018)

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