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"Reliability Evaluation and Redesign of LNA."

Wei-Cheng Lin, Long-Jei Du, Ya-Chin King (2004)

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DOI: 10.1016/J.MICROREL.2004.07.065

access: closed

type: Journal Article

metadata version: 2020-02-22

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Wei-Cheng Lin, Long-Jei Du, Ya-Chin King:
Reliability Evaluation and Redesign of LNA. Microelectron. Reliab. 44(9-11): 1727-1732 (2004)

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