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"A thorough investigation of hot-carrier-induced gate oxide breakdown in ..."
Hongxia Liu, Yue Hao, Jiangang Zhu (2002)
- Hongxia Liu, Yue Hao, Jiangang Zhu:
A thorough investigation of hot-carrier-induced gate oxide breakdown in partially depleted N- and P-channel SIMOX MOSFETs. Microelectron. Reliab. 42(7): 1037-1044 (2002)
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