"Long-term NBTI degradation under real-use conditions in IBM microprocessors."

Pong-Fei Lu et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.06.016

access: closed

type: Journal Article

metadata version: 2020-02-22

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Pong-Fei Lu, Keith A. Jenkins, Tobias Webel, Oliver Marquardt, Birgit Schubert:
Long-term NBTI degradation under real-use conditions in IBM microprocessors. Microelectron. Reliab. 54(11): 2371-2377 (2014)

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