BibTeX record journals/mr/LujanMRKGHM05

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@article{DBLP:journals/mr/LujanMRKGHM05,
  author    = {G. S. Lujan and
               Wim Magnus and
               L.{-}{\AA}. Ragnarsson and
               S. Kubicek and
               Stefan De Gendt and
               Marc M. Heyns and
               Kristin De Meyer},
  title     = {Modelling mobility degradation due to remote Coulomb scattering from
               dielectric charges and its impact on {MOS} device performance},
  journal   = {Microelectron. Reliab.},
  volume    = {45},
  number    = {5-6},
  pages     = {794--797},
  year      = {2005},
  url       = {https://doi.org/10.1016/j.microrel.2004.11.046},
  doi       = {10.1016/j.microrel.2004.11.046},
  timestamp = {Sat, 22 Feb 2020 19:27:35 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/LujanMRKGHM05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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