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"Comparison Between the Behaviour of Punch-Through and Non-Punch-Through ..."

Cheick Oumar Maïga et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.07.040

access: closed

type: Journal Article

metadata version: 2020-02-22

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Cheick Oumar Maïga, Hamid Toutah, Boubekeur Tala-Ighil, Bertrand Boudart:
Comparison Between the Behaviour of Punch-Through and Non-Punch-Through Insulated Gate Bipolar Transistors Under High Temperature Reverse Bias Stress. Microelectron. Reliab. 44(9-11): 1461-1465 (2004)

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