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"An introduction to fast wafer level reliability monitoring for integrated ..."

Andreas Martin, Rolf-Peter Vollertsen (2004)

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DOI: 10.1016/J.MICROREL.2004.04.008

access: closed

type: Journal Article

metadata version: 2021-02-11

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Andreas Martin, Rolf-Peter Vollertsen:
An introduction to fast wafer level reliability monitoring for integrated circuit mass production. Microelectron. Reliab. 44(8): 1209-1231 (2004)

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