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"Reliability issues in GaN-based light-emitting diodes: Effect of dc and ..."

Matteo Meneghini et al. (2012)

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DOI: 10.1016/J.MICROREL.2011.10.012

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/MeneghiniLRTZM12
Matteo Meneghini, Matteo Dal Lago, L. Rodighiero, Nicola Trivellin, Enrico Zanoni, Gaudenzio Meneghesso:
Reliability issues in GaN-based light-emitting diodes: Effect of dc and PWM stress. Microelectron. Reliab. 52(8): 1621-1626 (2012)

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