Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Thermoelectrical degradation processes in NTC thermistors for in-rush ..."

O. Mrooz et al. (2001)

> Home

Details and statistics

DOI: 10.1016/S0026-2714(01)00027-0

access: closed

type: Journal Article

metadata version: 2020-05-18

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/MroozKPSVBM01
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/MroozKPSVBM01
O. Mrooz, A. Kovalski, J. Pogorzelska, O. I. Shpotyuk, M. Vakiv, Bohdan S. Butkiewicz, J. Maciak:
Thermoelectrical degradation processes in NTC thermistors for in-rush current protection of electronic circuits. Microelectron. Reliab. 41(5): 773-777 (2001)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.