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"A review of DC extraction methods for MOSFET series resistance and ..."

Adelmo Ortiz-Conde et al. (2017)

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DOI: 10.1016/J.MICROREL.2016.12.016

access: closed

type: Journal Article

metadata version: 2020-10-26

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Adelmo Ortiz-Conde, Andrea Sucre-González, Fabián Zárate-Rincón, Reydezel Torres-Torres, Roberto S. Murphy-Arteaga, Juin J. Liou, Francisco J. García-Sánchez:
A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters. Microelectron. Reliab. 69: 1-16 (2017)

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