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"Reliability optimization of analog integrated circuits considering the ..."

Xin Pan, Helmut Graeb (2012)

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DOI: 10.1016/J.MICROREL.2011.09.026

access: closed

type: Journal Article

metadata version: 2020-02-22

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Xin Pan, Helmut Graeb:
Reliability optimization of analog integrated circuits considering the trade-off between lifetime and area. Microelectron. Reliab. 52(8): 1559-1564 (2012)

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