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"Low voltage SILC and P- and N-MOSFET gate oxide reliability."

Christian Petit et al. (2005)

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DOI: 10.1016/J.MICROREL.2004.08.002

access: closed

type: Journal Article

metadata version: 2022-06-17

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Christian Petit, A. Meinertzhagen, Damien Zander, O. Simonetti, M. Fadlallah, T. Maurel:
Low voltage SILC and P- and N-MOSFET gate oxide reliability. Microelectron. Reliab. 45(3-4): 479-485 (2005)

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