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"An exploration for the degradation behavior of 2-D electrostatic ..."

Dayong Qiao et al. (2018)

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DOI: 10.1016/J.MICROREL.2017.07.062

access: closed

type: Journal Article

metadata version: 2020-02-22

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Dayong Qiao, Rong Zhao, Yalong Zhang, Changfeng Xia, Xiumin Song, Qiaoming You:
An exploration for the degradation behavior of 2-D electrostatic microscanners by accelerated lifetime test. Microelectron. Reliab. 80: 284-293 (2018)

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