
BibTeX record journals/mr/SeoLKLHY05
@article{DBLP:journals/mr/SeoLKLHY05, author = {J. Y. Seo and K. J. Lee and Y. S. Kim and S. Y. Lee and S. J. Hwang and C. K. Yoon}, title = {Reliability for Recessed Channel Structure n-MOSFET}, journal = {Microelectron. Reliab.}, volume = {45}, number = {9-11}, pages = {1317--1320}, year = {2005}, url = {https://doi.org/10.1016/j.microrel.2005.07.013}, doi = {10.1016/j.microrel.2005.07.013}, timestamp = {Sat, 22 Feb 2020 19:26:40 +0100}, biburl = {https://dblp.org/rec/journals/mr/SeoLKLHY05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }

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