BibTeX record journals/mr/SeoLKLHY05

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@article{DBLP:journals/mr/SeoLKLHY05,
  author    = {J. Y. Seo and
               K. J. Lee and
               Y. S. Kim and
               S. Y. Lee and
               S. J. Hwang and
               C. K. Yoon},
  title     = {Reliability for Recessed Channel Structure n-MOSFET},
  journal   = {Microelectron. Reliab.},
  volume    = {45},
  number    = {9-11},
  pages     = {1317--1320},
  year      = {2005},
  url       = {https://doi.org/10.1016/j.microrel.2005.07.013},
  doi       = {10.1016/j.microrel.2005.07.013},
  timestamp = {Sat, 22 Feb 2020 19:26:40 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/SeoLKLHY05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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