"PVT variations aware low leakage INDEP approach for nanoscale CMOS circuits."

Vijay Kumar Sharma, Manisha Pattanaik, Balwinder Raj (2014)

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DOI: 10.1016/J.MICROREL.2013.09.018

access: closed

type: Journal Article

metadata version: 2023-09-30

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Vijay Kumar Sharma, Manisha Pattanaik, Balwinder Raj:
PVT variations aware low leakage INDEP approach for nanoscale CMOS circuits. Microelectron. Reliab. 54(1): 90-99 (2014)

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