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"ACF-COG interconnection conductivity inspection system using conductive area."

Xinjun Sheng et al. (2013)

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DOI: 10.1016/J.MICROREL.2012.11.004

access: closed

type: Journal Article

metadata version: 2022-11-02

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  - https://dblp.org/rec/journals/mr/ShengJXWD13
Xinjun Sheng, Lei Jia, Zhenhua Xiong, Zhiping Wang, Han Ding:
ACF-COG interconnection conductivity inspection system using conductive area. Microelectron. Reliab. 53(4): 622-628 (2013)

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