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"ESR concerns in tantalum chip capacitors exposed to non-oxygen-containing ..."

Jocelyn Siplon, Gary J. Ewell, Thomas Gibson (2002)

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DOI: 10.1016/S0026-2714(02)00020-3

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jocelyn Siplon, Gary J. Ewell, Thomas Gibson:
ESR concerns in tantalum chip capacitors exposed to non-oxygen-containing environments. Microelectron. Reliab. 42(6): 829-834 (2002)

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