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"Effects of high electric field and elevated-temperature bias stressing on ..."

Ninoslav Stojadinovic et al. (2002)

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DOI: 10.1016/S0026-2714(02)00039-2

access: closed

type: Journal Article

metadata version: 2023-09-30

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Ninoslav Stojadinovic, Ivica Manic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Sima Dimitrijev:
Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs. Microelectron. Reliab. 42(4-5): 669-677 (2002)

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