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"Improving the yield and reliability of the bulk-silicon HV-CMOS by adding ..."

Weifeng Sun, Longxing Shi (2005)

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DOI: 10.1016/J.MICROREL.2004.08.007

access: closed

type: Journal Article

metadata version: 2020-02-22

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Weifeng Sun, Longxing Shi:
Improving the yield and reliability of the bulk-silicon HV-CMOS by adding a P-well. Microelectron. Reliab. 45(1): 185-190 (2005)

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