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"Finite element analyses assisted Scanning Joule Expansion Microscopy on ..."

A.-K. Tiedemann et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.06.030

access: closed

type: Journal Article

metadata version: 2024-02-05

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  - https://dblp.org/rec/journals/mr/TiedemannKFHPB09
A.-K. Tiedemann, K. Kurz, M. Fakhri, Ralf Heiderhoff, J. C. H. Phang, L. J. Balk:
Finite element analyses assisted Scanning Joule Expansion Microscopy on interconnects for failure analysis and reliability investigations. Microelectron. Reliab. 49(9-11): 1165-1168 (2009)

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