"Self-testing of fully differential multistage circuits using common-mode ..."

Wojciech Toczek (2008)

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DOI: 10.1016/J.MICROREL.2008.09.007

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type: Journal Article

metadata version: 2021-05-19

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Wojciech Toczek:
Self-testing of fully differential multistage circuits using common-mode excitation. Microelectron. Reliab. 48(11-12): 1890-1899 (2008)

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