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"The Reliability of New Generation Power MOSFETs in Radiation Environment."
Francesco Velardi et al. (2002)
- Francesco Velardi, Francesco Iannuzzo, Giovanni Busatto, Jeffery Wyss, A. Kaminksy:
The Reliability of New Generation Power MOSFETs in Radiation Environment. Microelectron. Reliab. 42(9-11): 1629-1634 (2002)
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