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"Defining the safe operating area for HBTs with an InGaP emitter across ..."

Charles S. Whitman (2007)

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DOI: 10.1016/J.MICROREL.2007.02.005

access: closed

type: Journal Article

metadata version: 2020-02-22

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Charles S. Whitman:
Defining the safe operating area for HBTs with an InGaP emitter across temperature and current density. Microelectron. Reliab. 47(8): 1166-1174 (2007)

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