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"Estimating effective dielectric thickness for capacitors with extrinsic ..."

Charles S. Whitman (2008)

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Details and statistics

DOI: 10.1016/J.MICROREL.2008.02.001

access: closed

type: Journal Article

metadata version: 2020-02-22

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Charles S. Whitman:
Estimating effective dielectric thickness for capacitors with extrinsic defects by a statistical method. Microelectron. Reliab. 48(7): 965-973 (2008)

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