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"Modeling the sensitivity of CMOS circuits to radiation induced single ..."

Gilson I. Wirth et al. (2008)

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DOI: 10.1016/J.MICROREL.2007.01.085

access: closed

type: Journal Article

metadata version: 2021-10-14

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Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Lima Kastensmidt:
Modeling the sensitivity of CMOS circuits to radiation induced single event transients. Microelectron. Reliab. 48(1): 29-36 (2008)

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