![](https://dblp.org/img/logo.ua.320x120.png)
![](https://dblp.org/img/dropdown.dark.16x16.png)
![](https://dblp.org/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.org/img/search.dark.16x16.png)
![search dblp](https://dblp.org/img/search.dark.16x16.png)
default search action
"Breakdown and latent damage of ultra-thin gate oxides under ESD stress ..."
Jie Wu, Patrick Juliano, Elyse Rosenbaum (2001)
- Jie Wu, Patrick Juliano, Elyse Rosenbaum:
Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions. Microelectron. Reliab. 41(11): 1771-1779 (2001)
![](https://dblp.org/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.