"High resolution observation of defects at SiO2/4H-SiC ..."

Yuji Yamagishi, Y. Cho (2018)

Details and statistics

DOI: 10.1016/J.MICROREL.2018.07.058

access: closed

type: Journal Article

metadata version: 2020-10-28

a service of  Schloss Dagstuhl - Leibniz Center for Informatics