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"Methods of sequential test optimization in dynamic environment."

Chenglin Yang, Ruoshan Su, Bing Long (2017)

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DOI: 10.1016/J.MICROREL.2016.12.017

access: closed

type: Journal Article

metadata version: 2020-02-22

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Chenglin Yang, Ruoshan Su, Bing Long:
Methods of sequential test optimization in dynamic environment. Microelectron. Reliab. 70: 112-121 (2017)

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