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"A study of the effects of tunneling currents and reliability of sub-2 nm ..."
Nian Yang, Jimmie J. Wortman (2001)
- Nian Yang, Jimmie J. Wortman:
A study of the effects of tunneling currents and reliability of sub-2 nm gate oxides on scaled n-MOSFETs. Microelectron. Reliab. 41(1): 37-46 (2001)
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