"Voltage stress-induced hot carrier effects on SiGe HBT VCO."

Chuanzhao Yu, Enjun Xiao, J. S. Yuan (2005)

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DOI: 10.1016/J.MICROREL.2005.07.026

access: closed

type: Journal Article

metadata version: 2020-02-22

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Chuanzhao Yu, Enjun Xiao, J. S. Yuan:
Voltage stress-induced hot carrier effects on SiGe HBT VCO. Microelectron. Reliab. 45(9-11): 1402-1405 (2005)

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