"Molecular simulation on the material/interfacial strength of the ..."

Cadmus A. Yuan et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.07.052

access: closed

type: Journal Article

metadata version: 2023-09-30

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Cadmus A. Yuan, Olaf van der Sluis, G. Q. (Kouchi) Zhang, Leo J. Ernst, Willem D. van Driel, Richard B. R. van Silfhout:
Molecular simulation on the material/interfacial strength of the low-dielectric materials. Microelectron. Reliab. 47(9-11): 1483-1491 (2007)

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