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"Effect of 805 nm on reliability of 735/805/850-nm LED involved ..."

Yue Zhao et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.05.027

access: closed

type: Journal Article

metadata version: 2023-04-28

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Yue Zhao, Lina Qiu, Ke Zhao, Kai Li, Yunlong Sun, Lingkang Meng, Zhe Huang, Ting Li:
Effect of 805 nm on reliability of 735/805/850-nm LED involved near-infrared spectroscopy biomedical device. Microelectron. Reliab. 78: 406-410 (2017)

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