"Error Classification and Yield Prediction of Chips in Semiconductor ..."

L. Ludwig et al. (2000)

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DOI: 10.1007/S005210070013

access: closed

type: Journal Article

metadata version: 2020-09-10

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L. Ludwig, Elena P. Sapozhnikova, V. P. Lunin, Wolfgang Rosenstiel:
Error Classification and Yield Prediction of Chips in Semiconductor Industry Applications. Neural Comput. Appl. 9(3): 202-210 (2000)

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